THE EXAMINATION OF NAND FLASH MEMORIES AND LOW-LEVEL DATA RECOVERY FROM IT

Анотація

This paper suggests a low level approach for the examination of flash memories and describes low-level data acquisition methods for making full memory copies of flash memory devices. Artifacts, caused by flash specific operations like block erasing and wear leveling, are discussed and directions are given for enhanced data recovery and analysis on data originating from flash memory.

Keywords: NAND flash memory; bad-block management; flasher tools; level algorithm.